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SEM Delivers the Details

Image from Scanning Electron Microscope

An all new scanning electron microscope (SEM) has arrived at our labs in Durham, North Carolina, bringing new power and flexibility to your studies. The JEOL JSM-IT500HR field emission scanning electron microscope is the newest instrument in our fleet of transmission electron microscopes (TEMs), and adds energy dispersive spectroscopy capabilities to the lab.

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What does this mean for you?

The Electron Microscopy Laboratory can now provide full-service electron microscopy services to include SEM. The JEOL JSM-IT500HR is at the technologic forefront of SEM imaging and provides versatile surface imaging and elemental analysis of all kinds of scientific specimens.

How is this different from TEM?

While TEM specimens are limited to cross-sections of small, specially-prepared samples (thin sections of individual cells and viruses), the SEM can image a wide variety of biological and non-biological samples to provide topographical detail, ranging from individual bacterial cells and pharmaceutical crystalline structures (maximum resolution of 5 nm) to entire medical devices (that measure up to 10 x 10 x 6 cm).

This microscope is versatile, with a variable pressure option that offers both low-resolution (low-vacuum) imaging and high resolution (high-vacuum) imaging options. Low-vacuum imaging provides for elegant multimodal evaluation of valuable specimens such as implanted medical devices, as these can undergo topographical evaluation and possibly elemental analysis, and then associated tissues can be submitted for histologic examination. High-vacuum imaging requires additional processing and coating with a gold/palladium alloy and provides the highest level of topographical detail within an image.


Scanning Electron Microscopy

Our scanning electron microscope (SEM) can aid your medical device development and safety assessment. We’re able to run a variety of SEM studies to enhance your research and development program.

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What is EDS?

This scanning electron microscope has the option for elemental analysis using energy dispersive x-ray spectroscopy (EDS). During imaging, the x-ray spectra of the electrons bouncing off the material are characterized based on elemental composition. This valuable option is particularly useful for semi-quantitative characterization of metallic compounds and can be used for materials science, nanoparticle characterization, medical device studies, and more.

How can my study benefit from SEM?

Contact our electron microscopy experts to determine how your materials study, toxicology study, pharmaceutical study, or medical device program can benefit from this powerful technology today.